|Cleanroom - Manufacturing Microelectronics|
Changes to ISO 14644-1:• The most significant change is the adoption of a more consistent statistical approach to the selection and the number of sampling locations, and the evaluation of the data collected. The statistical model is an adaptation of the hypergeometric sampling model technique. The revised sampling method addresses rooms where the particle counts vary in a more complex manner
• ISO 14644 Part 1 retains the macroparticle descriptor concept; however, consideration of nano-scale particles (formerly defined as ultrafine particles) will be addressed in a separate standard.
• The new title, “Classification of Air Cleanliness by Particle Concentration” is consistent with other parts of ISO 14644.
• Minor revisions to the ISO cleanliness classes are reflected in tables whose use ensures better definition of the appropriate particle-size ranges for the different classes.
The latest editions of related standards are integral to the implementation of ISO 14644 Part 1
ISO 14644-2:2015, Cleanrooms and associated controlled environments — Part 2: Monitoring to provide evidence of cleanroom performance related to air cleanliness by particle concentration
ISO 14644-7, Cleanrooms and associated controlled environments — Part 7: Separative devices (clean air hoods, gloveboxes, isolators and mini-environments)
Cleanrooms and associated controlled environments are used in the aerospace, microelectronics, pharmaceutical, medical device, healthcare and food industries.